HIOKI FA1283 高密度飛針測試機
1/2 Impact Mark Depth, High-Accuracy Probing, Low-Resistance Measurement, High-Speed 100 GΩ/250V Measurement, Vacuum Unit for Capacitance Test, Embedded Device Measurement.
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產品特色
- Horizontal Double-Sided Flying Probe Tester 2 Upper Probes + 2 Lower Probes
- Complete Electrical Testing of High-Function Boards with a Single Unit.
- High-Speed Testing at up to 100 point/sec.
- Significant expansion of the guaranteed range of low resistance and ultra-insulation testing.
- Embedded Device Measurement: A Sharp Departure from LCR Measurement.
- 1/2 Impact Mark Depth, High-Accuracy Probing, Low-Resistance Measurement, High-Speed 100 GΩ/250V Measurement, Vacuum Unit for Capacitance Test, Embedded Device Measurement.
產品資訊
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原廠名稱
HIOKI -
製程名稱
測試/檢查/品管篇 -
英文名稱
FA1283 Flying Probe Tester -
產品細目
測試機
