GATS-7755 基板治具测试机
"实现细线路FC-CSP的高速高精度测试，新世代无芯基板电测设备登场！” GATS-7755基板测试机搭载双测试台面，适用于大批量生产的细间距板的批量检测，实现对MCM / MCP / BGA / CSP等产品进行断短路检测。 “High speed & accuracy inspection for Fine Pitch FC-CSP, Next-generation’s inspection system available for core-less substrate!” The GATS-7755 is a substrate inspection system with Double-table (shuttle style) which is suitable for batch inspection of mass-produced fine-pitch boards. The GATS-7755 tester can perform Open/Short inspection for MCM/MCP/BGA/CSP, etc.
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产品特色
- 双载台工作模式，台面A执行电测时台面B同时开始光学对位，减少无效工时。 Double-table, Shuttle style. Aligning the board while performing inspection simultaneously.
- 超高精度， 总体对位精度达到±2.5μm。 ULTRA High Accuracy, Comprehensive alignment accuracy within 2.5μm.
- 搭载标准万用载台， 自带标准万用载台，亦可搭配专用载台。 Standardized Universal Work Holder, Standardized work holder is installed (universal/dedicated).
- Best for core-less substrate, Achieving testing 0.1mm board.薄板测试能力优良，可实现0.1mm载板的测试。
- 高速检查， 扫描功能卡与针盘直接连接，数据处理速度提升。 High speed inspection, Employing cable-less scanner boards, data processing speed increase.
产品信息
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原厂名称
NIDEC-READ -
制程名称
测试/检查/品管篇 -
英文名称
GATS-7755 Substrate Open/Leak automatic inspection system -
产品细目
测试机
